TEM for Characterization of Nanowires and Nanorods
Transmission Electron Microscopy Characterization of Nanomaterials
Definition of Topic
Transmission electron microscopy (TEM) and related techniques allow for imaging of nanomaterials to determine the material size, shape, composition, and crystal structure. In situ TEM measurements allow for observation of dynamic processes, such as nonowire growth. This chapter describes the application of ex situ and in situ TEM techniques to the analysis of nanowires/nanorods as a subset of nanomaterials. Nanowires refer to anisotropic metal, semiconductor, metal oxide, and/or alloyed structure that may be cylindrical solids, core-shell structures, or hollow tube-like structures. Herein, "bottom-up" nanowires -- those synthesized by monomer addition or particle aggregation -- are considered for how their analyses may be aided by TEM-based techniques. Lithographically defined wire-like structures, carbon nanotubes, and graphene-based scroll structures are not considered in this chapter.
St. Angelo, Sarah K. "TEM for Characterization of Nanowires and Nanorods." In Transmission Electron Microscopy Characterization of Nanomaterials, edited by Challa S. S. R. Kumar, 195-241.